Published July 9, 2003
| Version v1
Journal article
Radiation detectors of PIN type for X-rays
Creators
- 1. Instituto Tecnologico de Toluca, Av Tecnologico S/N, Metepec (Mexico)
- 2. Instituto Nacional de Investigaciones Nucleares, km. 36.5 Carretera Mexico-Toluca, Ocoyoacac, 52045 (Mexico)
Description
In this laboratory session, tree experiments are proposed: the measurement of X-ray energy spectra from radioactive sources with a high resolution cooled Si-Li detector, with a room temperature PIN diode and the measurement of the response of a PIN diode to the intensity of X-rays of radio-diagnostic units. The spectra obtained with the Si-Li detector help to understand the energy distribution of X-rays and are used as a reference to compare the results obtained with the PIN diode. Measurements in medical X-ray machines are proposed. Low cost, simple electronic instruments and systems are used as tools to make measurements in X-ray units used in radio-diagnostic
Additional details
Identifiers
- DOI
- 10.1063/1.1604089;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 674
- Journal Issue
- 1
- Journal Page Range
- p. 313-335
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- ICFA school on instrumentation in elementary particle physics
- Dates
- 18-29 Nov 2002
- Place
- Morelia, Michoacan (Mexico)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35055505
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALIBRATION; DATA PROCESSING; ENERGY RESOLUTION; ENERGY SPECTRA; LI-DRIFTED SI DETECTORS; SIGNALS; X-RAY DETECTION; X-RAY SPECTRA; X-RAY SPECTROSCOPY
- Descriptors DEC
- DETECTION; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; PROCESSING; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- (c) 2003 American Institute of Physics