Published May 2011 | Version v1
Journal article

Microstructural investigation of Sr-modified Al-15 wt%Si alloys in the range from micrometer to atomic scale

  • 1. Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin (Germany)
  • 2. Technische Universitaet Berlin, Werkstoffwissenschaften und -Technologien, Hardenbergstr. 36, 10623 Berlin (Germany)

Description

Strontium-modified Al-15 wt%Si casting alloys were investigated after 5 and 60 min of melt holding. The eutectic microstructures were studied using complementary methods at different length scales: focused ion beam-energy selective backscattered tomography, transmission electron microscopy and 3D atom probe. Whereas the samples after 5 min of melt holding show that the structure of eutectic Si changes into a fine fibrous morphology, the increase of prolonged melt holding (60 min) leads to the loss of Sr within the alloy with an evolution of an unmodified eutectic microstructure displaying coarse interconnected Si plates. Strontium was found at the Al/Si eutectic interfaces on the side of the eutectic Al region, measured by 3D atom probe. The new results obtained using 3D atom probe shed light on the location of Sr within the Al-Si eutectic microstructure. -- Research highlights: → Microstructural investigation of Sr-modified Al-15 wt%Si alloy after 5 and 60 min of melt holding using 3D microscopy techniques. → FIB-EsB tomography: Fibrous eutectic modification of Si after 5 min of melt holding; unmodified eutectic microstructure after 60 min of melt holding. → Structural and chemical analysis of Fe-rich intermetallic phases using TEM: Fe-rich α-phases are present in the eutectic microstructure after 60 min of melt holding; no Fe rich α-phases are observed within the modified fibrous network after 5 min of melt holding. → 3D-AP analysis of specimens containing A/Si eutectic interfaces: enrichment of Sr is found at the Al/Si interface on the side of the eutectic Al region.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2010.12.023

Additional details

Identifiers

DOI
10.1016/j.ultramic.2010.12.023;
PII
S0304-3991(10)00365-7;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
111
Journal Issue
6
Journal Page Range
p. 695-700
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
52. international field emission symposium
Acronym
IFES2010
Dates
5-8 Jul 2010
Place
Sydney (Australia)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45025338
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM BASE ALLOYS; ATOMS; CASTING; CHEMICAL ANALYSIS; EUTECTICS; INTERFACES; INTERMETALLIC COMPOUNDS; ION BEAMS; MICROSTRUCTURE; MODIFICATIONS; MORPHOLOGY; PLATES; PROBES; SILICON ALLOYS; STRONTIUM ADDITIONS; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; VISIBLE RADIATION
Descriptors DEC
ALLOYS; ALUMINIUM ALLOYS; BEAMS; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FABRICATION; MICROSCOPY; RADIATIONS; STRONTIUM ALLOYS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.