Fullerene-like B-C-N thin films: a computational and experimental study
Creators
- 1. Department of Physics, IFM, Linkoeping University, S-58 183 Linkoeping (Sweden)
Description
Ab initio calculations show that the energy cost for incorporating lattice defects such as pentagons and heptagons is significantly reduced for BCN compared to BN, thus promoting bending of basal planes in these compounds. Boron-carbon-nitride (B-C-N) thin films with a fullerene-like (FL) microstructure were then deposited by dual cathode magnetron sputtering from C and B4C targets. Up to 1 μm thick films were grown at a total gas pressure of 3 mTorr (0.4 Pa) in varying Ar/N2 ratios, and substrate temperatures between 225 and 350 deg. C. Compositional and microstructural studies were performed using RBS, SEM and HREM, respectively. Depending on the deposition condition, ternary BxCyNz films with fullerene-like microstructure could be prepared in agreement with the calculations within the composition range 0 ≤ x ≤ 53, 15 ≤ y ≤ 62, and 24 ≤ z ≤ 50 at.%. Fullerene-like structures also tend to form at lower temperatures in the case of BCN compared to CN. Nanoindentation measurements show that all BxCyNz films exhibited a highly elastic response independent of elemental composition. In addition, the calculations suggest a driving force for C and BN phase separation
Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2004.08.013;
- PII
- S0921-5107(04)00430-1;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 113
- Journal Issue
- 3
- Journal Page Range
- p. 242-247
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36047493
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BORON; BORON CARBIDES; BORON NITRIDES; CARBON NITRIDES; CATHODES; CRYSTAL DEFECTS; DEPOSITION; MAGNETRONS; MICROSTRUCTURE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BORON COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CRYSTAL STRUCTURE; ELECTRODES; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SEMIMETALS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.