A Schiff base modified graphene oxide film for anodic stripping voltammetric determination of arsenite

A protocol is described for chemical modification of graphene oxide with a Schiff base derived from diethylenetriamine and 2-hydroxy-4-methoxybenzophenone. The base was grafted onto an indium tin oxide (ITO) film and applied to electroanalytical determination of arsenite. Successful grafting was confirmed by Fourier transform-infrared spectroscopy, spectrophotometry, field emission scanning electron microscopy and cyclic voltammetry. Secondly, the coated ITO film served as a working electrode for the stripping voltammetric determination of arsenite. The analytical signal is generated by selective oxidation of metal species via multi-donor sites present in the derivatized Schiff base. The electroanalytical protocol was optimized by investigating the effects of deposition time, working potential, frequency and amplitude of square wave anodic stripping voltammetry. The method has attractive features including (a) the usage of a non-metallic, non-toxic and cost-effective material; (b) improved sensitivity (with limit of detection as low as 156 pM) due to better adsorption of arsenite in the Schiff base pockets on the ITO, and (c) the application to the determination of arsenite in real samples.

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