Influence of consumed power on structural and nano-mechanical properties of nano-structured diamond-like carbon thin films
- 1. Department of Physics, Indian Institute of Technology Delhi, New Delhi 110016 (India)
- 2. Plasma Processed Materials Group, CSIR-National Physical Laboratory, Dr. K.S. Krishnan Road, New Delhi 110012 (India)
Description
Highlights: • PECVD deposition of DLC films. • Plasma characterization by VI probe. • Structural and nano-mechanical properties. • High hardness is observed in DLC films. - Abstract: Mixed Ar–C2H2 plasma was characterized by VI probe for estimating the actual consumed power (CP) in the plasma and its effect on diamond-like carbon (DLC) thin films deposited at different CPs in the range 16–85 W. The structural properties of the films were examined using variety of spectroscopic and microscopic techniques, such as Fourier Transform Infrared spectroscopy, X-ray Photoelectron Spectroscopy, Micro-Raman Spectroscopy and Atomic Force Microscopy. The film deposited at 36 W CP showed the formation of nano-structure, creation of optimum sp3/sp2 bonding ratio and excellent nano-mechanical properties with the maximum hardness of ∼28.2 GPa. However, the nano-mechanical properties of the films got altered with the variation of CP, which is attributed to the changes seen in the structural properties. These findings show that high quality DLC films with higher hardness can be deposited by monitoring and controlling the process parameters of the plasma
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2014.02.023Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2014.02.023;
- PII
- S0169-4332(14)00307-9;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 300
- Journal Page Range
- p. 141-148
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46028975
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; DEPOSITS; DIAMONDS; FOURIER TRANSFORM SPECTROMETERS; HARDNESS; NANOSTRUCTURES; PLASMA; PRESSURE RANGE GIGA PA; RAMAN SPECTROSCOPY; THIN FILMS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBON; CHEMICAL COATING; DEPOSITION; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; LASER SPECTROSCOPY; MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; MICROSCOPY; MINERALS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PRESSURE RANGE; SPECTROMETERS; SPECTROSCOPY; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.