Published 1978 | Version v1
Report Restricted

Soft x-ray, vacuum ultraviolet diagnostics of high density, high temperature plasmas

Creators

Description

A grazing incidence spectrograph in conjunction with XRD's can be used for spectral and total flux measurements below 600 eV with an accuracy of about +-50%. A convex curved crystal spectrograph can be used in conjunction with PIN detectors above 600 eV for total flux and spectral measurements to an accuracy of about +-20%

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.

Files

Restricted

The record is publicly accessible, but files are restricted to users with access.

Additional details

Publishing Information

Imprint Pagination
6 p.
Report number
SAND--78-1344C

Conference

Title
JOPWOG-6/SubWOG-268 meeting.
Dates
27 - 30 Jun 1978.
Place
Albuquerque, NM, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
10428088
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ENERGY SPECTRA; FAR ULTRAVIOLET RADIATION; HOT PLASMA; PLASMA DIAGNOSTICS; SOFT X RADIATION; X-RAY SPECTROMETERS
Descriptors DEC
ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; PLASMA; RADIATIONS; SPECTRA; SPECTROMETERS; ULTRAVIOLET RADIATION; X RADIATION

Optional Information

Secondary number(s)
CONF-780679--2.