Published March 1980
| Version v1
Journal article
Atomic beam diffraction from solid surfaces
Description
Atomic beam diffraction has become a powerful tool for surface structural investigations. The requirements for an apparatus capable of atomic diffraction under UHV conditions are discussed and the theoretical framework necessary for quantitative analysis of diffraction data is outlined. Recent results obtained on ionic crystals, semiconductors, metals and adsorbate-covered surfaces are reviewed. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods
- Journal Volume
- 170
- Journal Issue
- 1-3
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 483-487
- ISSN
- 0029-554X
Conference
- Title
- 8. international conference on atomic collisions in solids.
- Dates
- 13 - 17 Aug 1979.
- Place
- Hamilton, Canada.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 12574441
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC BEAM DIFFRACTION; CRYSTAL STRUCTURE; MATERIALS TESTING; METALS; SEMICONDUCTOR MATERIALS; SURFACES
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELEMENTS; SCATTERING; TESTING