Published September 24, 2001 | Version v1
Miscellaneous Metadata-only

Single Event Burnout in DC-DC Converters for the LHC Experiments

Creators

Description

High voltage transistors in DC-DC converters are prone to catastrophic Single Event Burnout in the LHC radiation environment. This paper presents a systematic methodology to analyze single event effects sensitivity in converters and proposes solutions based on de-rating input voltage and output current or voltage

Availability note (English)

Available from PURL: https://www.osti.gov/servlets/purl/786645-fN5jzB/native/

Additional details

Identifiers

URL
https://www.osti.gov/servlets/purl/786645-fN5jzB/native/;

Publishing Information

Imprint Pagination
60 Kilobytes
Report number
FERMILAB-Conf--01/250-E

Conference

Title
RADECS 2001
Dates
10-14 Sep 2001
Place
Grenoble (France)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
32065239
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
DC TO DC CONVERTERS; FAILURES; HADRONS; LINEAR COLLIDERS; MITIGATION; RECOMMENDATIONS; SENSITIVITY; TRANSISTORS
Descriptors DEC
ACCELERATORS; ELECTRICAL EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; LINEAR ACCELERATORS; SEMICONDUCTOR DEVICES

Optional Information

Contract/Grant/Project number
AC02-76CH03000
Funding organization
USDOE Office of Energy Research (ER) (United States)