Published August 30, 2008 | Version v1
Journal article

Tribological behavior of diamond-like carbon film with different tribo-pairs: A size effect study

  • 1. State Key Laboratory of Tribology, Tsinghua University, Beijing 100084 (China)
  • 2. College of Mechanical and Electrical Engineering, Wenzhou University, Wenzhou 323035 (China)
  • 3. School of Science, Zhejiang University of Science and Technology, Hangzhou 310023 (China)

Description

A friction force microscope (FFM) with different probes and a ball-on-disk (BOD) tribo-meter were used to investigate the tribological properties of diamond-like carbon (DLC) films. DLC films were prepared by chemical vapor deposition (CVD) method by altering the deposition parameters, and their morphologies and structural information were examined with an atomic force microscope (AFM) and the Raman spectrum. The wear traces of the DLC films after frictional tests were analyzed by an optical microscope. It is found that surface roughness and adhesion play important roles in characterizing the tribological properties of DLC films using FFM. Moreover, the debris accumulation is another significant factor affecting the frictional behavior of DLC films, especially for the sharp tip. The difference in coefficients of friction (COFs) obtained by the BOD method among different DLC films under water lubrication is much smaller than the case without water lubrication. The variation trends in COF for the flat tip and the BOD test are similar in comparison with the result obtained with the sharp tip. The wear traces after frictional tests suggest that DLC films under water lubrication are prone to be damaged more readily

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.05.119

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.05.119;
PII
S0169-4332(08)01172-0;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
254
Journal Issue
21
Journal Page Range
p. 7022-7028
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40033669
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; DIAMONDS; FILMS; FRICTION; LUBRICATION; MORPHOLOGY; OPTICAL MICROSCOPES; RAMAN SPECTRA; SURFACES
Descriptors DEC
CARBON; CHEMICAL COATING; DEPOSITION; ELEMENTS; MICROSCOPES; MICROSCOPY; MINERALS; NONMETALS; SPECTRA; SURFACE COATING

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.