Published 2016
| Version v1
Journal article
Boosted Jet Tagging with Jet-Images and Deep Neural Networks
Creators
- 1. SLAC National Accelerator Laboratory, Menlo Park, CA (United States)
- 2. Stanford University, Stanford, CA (United States)
Description
Building on the jet-image based representation of high energy jets, we develop computer vision based techniques for jet tagging through the use of deep neural networks. Jet-images enabled the connection between jet substructure and tagging with the fields of computer vision and image processing. We show how applying such techniques using deep neural networks can improve the performance to identify highly boosted W bosons with respect to state-of-the-art substructure methods. In addition, we explore new ways to extract and visualize the discriminating features of different classes of jets, adding a new capability to understand the physics within jets and to design more powerful jet tagging methods
Availability note (English)
Available from http://www.epj-conferences.org/articles/epjconf/pdf/2016/22/epjconf_dots2016_00009.pdf; https://doaj.org/article/27e85f8a41024a9894fb8cdda6952361; http://dx.doi.org/10.1051/epjconf/201612700009Additional details
Identifiers
Publishing Information
- Journal Title
- EPJ. Web of Conferences
- Journal Volume
- 127
- Journal Page Range
- 00009 p.
- ISSN
- 2100-014X
Conference
- Title
- Connecting the Dots
- Dates
- 22-24 Feb 2016
- Place
- Vienna (Austria)
INIS
- Country of Publication
- France
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48007605
- Subject category
- S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- IMAGE PROCESSING; JET MODEL; NEURAL NETWORKS; PARTICLE IDENTIFICATION; W MINUS BOSONS; W PLUS BOSONS
- Descriptors DEC
- BOSONS; ELEMENTARY PARTICLES; INTERMEDIATE BOSONS; INTERMEDIATE VECTOR BOSONS; MATHEMATICAL MODELS; PARTICLE MODELS; PROCESSING
Optional Information
- Copyright
- Copyright (c) 2016 The Authors. Published by EDP Sciences