Published July 2006
| Version v1
Journal article
Structural characterization of β-SiC nanowires synthesized by direct heating method
Creators
- 1. Surface Chemistry Laboratory of Electronic Materials, Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784 (Korea, Republic of)
Description
Crystal structure of β-SiC nanowires was investigated using Raman spectroscopy, FT-IR, XRD, transmission electron microscopy and selected area electron diffraction. Cubic β-SiC nanowires were synthesized by heating NiO catalyzed Si substrates with WO3 and graphite mixed powders in the growth temperature of 1000-1100 deg. C. HRTEM image showed atomic arrangements of the grown SiC nanowires with a main growth direction of [111]. Raman spectra showed two characteristic peaks at 796 cm-1 and 968 cm-1, which are corresponding to transversal optic mode and longitudinal optic mode of β-SiC, respectively. Also, FT-IR absorption spectroscopy showed a SiC characteristic absorption band at ∼792 cm-1
Additional details
Identifiers
- DOI
- 10.1016/j.msec.2005.09.083;
- PII
- S0928-4931(05)00325-5;
Publishing Information
- Journal Title
- Materials Science and Engineering. C, Biomimetic Materials, Sensors and Systems
- Journal Volume
- 26
- Journal Issue
- 5-7
- Journal Page Range
- p. 805-808
- ISSN
- 0928-4931
Conference
- Title
- Symposium A - Current trends in nanoscience - from materials to applications
- Acronym
- EMRS spring meeting 2005
- Dates
- 31 May - 3 Jun 2005
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38066204
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; FOURIER TRANSFORMATION; GRAPHITE; HEATING; INFRARED SPECTRA; LIQUIDS; NICKEL OXIDES; POWDERS; QUANTUM WIRES; RAMAN SPECTRA; RAMAN SPECTROSCOPY; SOLIDS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTATES; TUNGSTEN OXIDES; WIRES; X-RAY DIFFRACTION
- Descriptors DEC
- CARBON; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FLUIDS; INTEGRAL TRANSFORMATIONS; LASER SPECTROSCOPY; MICROSCOPY; MINERALS; NANOSTRUCTURES; NICKEL COMPOUNDS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; SCATTERING; SPECTRA; SPECTROSCOPY; TRANSFORMATIONS; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.