Published January 21, 2005 | Version v1
Journal article

Measuring the absolute light yield of scintillators

  • 1. Delft University of Technology, I.R.I., Mekelweg 15, 2629 JB Delft (Netherlands)

Description

The absolute light yield of four different scintillation materials measured with two photomultiplier tubes and two avalanche photodiodes is presented. Commonly, the photoelectron yields and electron-hole pair yields are corrected for the quantum efficiency of the detector, as specified by the manufacturer, to obtain the absolute photon yield. However, the effective quantum efficiency under scintillation measurement conditions is substantially higher due to back reflection. Only when back reflection is properly accounted for, the absolute photon yields obtained with the photomultipliers agree with those obtained with the photodiodes. The effect of optical coupling between the scintillator and detector is also discussed

Additional details

Identifiers

DOI
10.1016/j.nima.2004.07.243;
PII
S0168-9002(04)01791-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
537
Journal Issue
1-2
Journal Page Range
p. 97-100
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
7. international conference on inorganic scintillators and their use in scientific and industrial applications
Acronym
SCINT 2003
Dates
8-12 Sep 2003
Place
Valencia (Spain)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37033225
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
HOLES; PHOSPHORS; PHOTODIODES; PHOTOMULTIPLIERS; PHOTONS; QUANTUM EFFICIENCY; REFLECTION; SCINTILLATIONS; VISIBLE RADIATION; YIELDS
Descriptors DEC
BOSONS; EFFICIENCY; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; MASSLESS PARTICLES; PHOTOTUBES; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.