Published January 21, 2005
| Version v1
Journal article
Measuring the absolute light yield of scintillators
- 1. Delft University of Technology, I.R.I., Mekelweg 15, 2629 JB Delft (Netherlands)
Description
The absolute light yield of four different scintillation materials measured with two photomultiplier tubes and two avalanche photodiodes is presented. Commonly, the photoelectron yields and electron-hole pair yields are corrected for the quantum efficiency of the detector, as specified by the manufacturer, to obtain the absolute photon yield. However, the effective quantum efficiency under scintillation measurement conditions is substantially higher due to back reflection. Only when back reflection is properly accounted for, the absolute photon yields obtained with the photomultipliers agree with those obtained with the photodiodes. The effect of optical coupling between the scintillator and detector is also discussed
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2004.07.243;
- PII
- S0168-9002(04)01791-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 537
- Journal Issue
- 1-2
- Journal Page Range
- p. 97-100
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 7. international conference on inorganic scintillators and their use in scientific and industrial applications
- Acronym
- SCINT 2003
- Dates
- 8-12 Sep 2003
- Place
- Valencia (Spain)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37033225
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- HOLES; PHOSPHORS; PHOTODIODES; PHOTOMULTIPLIERS; PHOTONS; QUANTUM EFFICIENCY; REFLECTION; SCINTILLATIONS; VISIBLE RADIATION; YIELDS
- Descriptors DEC
- BOSONS; EFFICIENCY; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; MASSLESS PARTICLES; PHOTOTUBES; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.