Published August 1, 2002
| Version v1
Miscellaneous
DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS
Description
A261. DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS
Availability note (English)
Available from Oakland Operations Office, Oakland, CA (US); INISAdditional details
Publishing Information
- Imprint Pagination
- [vp.]
Conference
- Title
- 14. Topical Conference on High Temperature Plasma Diagnostics
- Dates
- 8-11 Jul 2002
- Place
- Madison, WI (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 34037087
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- CAMERAS; DIAGNOSIS; DOUBLET-3 DEVICE; EDGE LOCALIZED MODES; PLASMA DIAGNOSTICS
- Descriptors DEC
- CLOSED PLASMA DEVICES; INSTABILITY; PLASMA INSTABILITY; PLASMA MACROINSTABILITIES; THERMONUCLEAR DEVICES; TOKAMAK DEVICES
Optional Information
- Contract/Grant/Project number
- AC--03-99ER54463
- Notes
- THIS IS A PREPRINT OF A PAPER TO BE PRESENTED AT THE 14TH TOPICAL CONFERENCE ON HIGH TEMPERATURE PLASMA DIAGNOSTICS, JULY 8-11, 2002, MADISON, WISCONSIN, AND TO BE PUBLISHED IN THE ''PROCEEDINGS''
- Funding organization
- United States (United States)