Published October 1, 2010
| Version v1
Journal article
Progress in high-linearity multi-element Josephson structures
- 1. Physics Department, Moscow State University, 119992 Moscow (Russian Federation)
- 2. HYPRES, Inc., 175 Clearbrook Road, Elmsford, NY 10523 (United States)
Description
This paper summarizes both theoretical and experimental studies aimed at synthesis of high-linearity multi-element Josephson structures. Both the dynamic range and the voltage response linearity are two conjugated characteristics that must be improved jointly. Increase in dynamic range is reasonably associated with increase of number of elements N in the Josephson-junction structures. To improve the voltage response linearity one can use special design of the array structures. The other way is based on use novel basic cell with is bi-SQUID capable of providing highly linear voltage response. Both the approaches were used in designs of the reported high-linearity multi-element Josephson structures.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physc.2010.02.048Additional details
Identifiers
- DOI
- 10.1016/j.physc.2010.02.048;
- PII
- S0921-4534(10)00155-3;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 470
- Journal Issue
- 19
- Journal Page Range
- p. 886-889
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- 6. international conference in school format on vortex matter in nanostructured superconductors
- Acronym
- VORTEX VI
- Dates
- 17-24 Sep 2009
- Place
- Rhodes (Greece)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42000685
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESIGN; ELECTRIC POTENTIAL; JOSEPHSON JUNCTIONS; SQUID DEVICES; SUPERCONDUCTIVITY; SYNTHESIS
- Descriptors DEC
- ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; PHYSICAL PROPERTIES; SUPERCONDUCTING DEVICES; SUPERCONDUCTING JUNCTIONS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.