Published June 5, 1993
| Version v1
Journal article
Electron impact ionization of singly - and doubly-charged fullerene ions
- 1. Institut fuer Kernphysik, Justus-Liebig-Universitaet Giessen, D-6300 Giessen (Germany)
Description
Ion beams of Cq+60 and Cq+70 fullerene ions and their fragments with q up to 3 have been extracted from an ECR ion source. The spectrum of reaction products in collisions of C+60 ions with 200 eV electrons has been recorded. Cross sections for electrons impact ionization C+60 and C2+60 ions have been measured in a crossed-beams experiment
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 274
- Journal Issue
- 1
- Journal Page Range
- p. 481-484.
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 6. international conference on physics of highly charged ions.
- Dates
- 28 Sep - 2 Oct 1992.
- Place
- Manhattan, KS (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 25038211
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM-BEAM INTERACTIONS; CARBON IONS; ELECTRON-ION COLLISIONS; EV RANGE 100-1000; FRAGMENTATION; FULLERENES; IONIZATION; MULTICHARGED IONS
- Descriptors DEC
- CARBON; CHARGED PARTICLES; COLLISIONS; ELECTRON COLLISIONS; ELEMENTS; ENERGY RANGE; EV RANGE; ION COLLISIONS; IONS; NONMETALS
Optional Information
- Secondary number(s)
- CONF-920948--.