Real and reciprocal space structural correlations contributing to the first sharp diffraction peak in silica glass
- 1. PRESTO, Japan Science and Technology Agency, Honcho Kawaguchi, Saitama 332-0012 (Japan)
- 2. Department of Chemistry, Kobe University, Nada-ku, Kobe 657-8501 (Japan)
- 3. Department of Chemistry, University of Cambridge, Cambridge CB2 1EW (United Kingdom)
Description
We have applied a 'real-reciprocal space analysis', using the continuous wavelet transform technique, to the experimental neutron and x-ray structure factors of silica glass to elucidate a correlation between the 'first sharp diffraction peak (FSDP)' in reciprocal space and the corresponding length scale in real space. The present analysis allows us to obtain compelling evidence that the dominant interatomic distance linked to the FSDP in silica glass is ∼5 A, although longer distances are also important, making an exponentially decreasing contribution. Further analysis using molecular-dynamics simulations demonstrates that the interatomic spatial correlations at r∼5 A are associated with a couple of local 'pseudo-Bragg' planes having an interlayer separation of ∼4 A, accounting for the origin of structural ordering on the medium-range length scale in silica glass
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 71
- Journal Issue
- 1
- Journal Page Range
- p. 014202-014202.5
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36102929
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- GLASS; INTERATOMIC DISTANCES; MOLECULAR DYNAMICS METHOD; NEUTRON DIFFRACTION; SILICA; SIMULATION; STRUCTURE FACTORS; X-RAY DIFFRACTION
- Descriptors DEC
- CALCULATION METHODS; COHERENT SCATTERING; DIFFRACTION; DISTANCE; MINERALS; OXIDE MINERALS; SCATTERING
Optional Information
- Notes
- (c) 2005 The American Physical Society