Published 1982
| Version v1
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The consequences of the neglect of TDS correction for temperature parameters
Description
The importance of carrying out TDS corrections in analyses of charge density distributions from x-ray diffraction data is emphasized. Their relative effect on derived temperature parameter values is discussed and shown to rely primarily on the experimental conditions and not on the softness of the crystal
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14718177.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 17 p.
- Report number
- UM-P--82/40
INIS
- Country of Publication
- Australia
- Country of Input or Organization
- Australia
- INIS RN
- 14718177
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BRAGG CURVE; CHARGE DENSITY; CORRECTIONS; SPATIAL DISTRIBUTION; STRUCTURAL CHEMICAL ANALYSIS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIAGRAMS; DIFFRACTION; DISTRIBUTION; INFORMATION; SCATTERING