Reliability evaluation programmable logic devices

Programmable Logic Devices (PLD) are widely used as basic building modules in high integrity systems, considering their robust features such as gate density, performance, speed etc. PLDs are used to implement digital design such as bus interface logic, control logic, sequencing logic, glue logic etc. Due to semiconductor evolution, new PLDs with state-of-the-art features are arriving to the market. Since these devices are reliable as per the manufacturer's specification, they were used in the design of safety systems. But due to their reduced market life, the availability of performance data is limited. So evaluating the PLD before deploying in a safety system is very important. This paper presents a survey on the use of PLDs in the nuclear domain and the steps involved in the evaluation of PLD using Quantitative Accelerated Life Testing. (author)