Surface and interface properties for the Cu/W(110) system and their effect on oxygen adsorption
- 1. Sandia National Laboratory, Albuquerque, New Mexico 87185 (United States)
- 2. AT ampersand T Bell Laboratory, Murray Hill, New Jersey 07974 (United States)
Description
The results of angle-resolved ultraviolet photoemission measurements and electronic-structure calculations are presented for Cu adsorbed on the W(110) surface. Data as a function of Cu coverage suggest the existence of sets of surface and interface states resulting from the Cu-W interaction. Calculations corroborate this suggestion and identify the surface and interface character and orbital symmetries of the states. Near the zone boundary along the bar Γ-bar H symmetry line, these states lie in gaps in the projected bulk band structure for the W(110) surface and are localized either within the Cu overlayer (surface states) or shared between the Cu and first W layer (interface states). Reasonable agreement is obtained between experiment and theory. We also performed low-energy electron diffraction and measured the behavior of the surface and interface states with O2 coverage. We conclude that the enhancement of the O2 dissociative sticking coefficient for the 1-monolayer Cu film results from an increase in the precursor-state accommodation coupled with the ability of Cu to displace easily giving O2 continued access to the more active W surface
Additional details
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter
- Journal Volume
- 45
- Journal Issue
- 4
- Journal Page Range
- p. 1811-1819.
- ISSN
- 0163-1829
- CODEN
- PRBMDO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24018199
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CHEMISORPTION; COPPER; COPPER OXIDES; DECOMPOSITION; DISSOCIATION ENERGY; ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; ENERGY GAP; EPITAXY; OXIDATION; OXYGEN; PHOTOEMISSION; SORPTIVE PROPERTIES; TUNGSTEN; TUNGSTEN OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; COPPER COMPOUNDS; CRYSTAL GROWTH METHODS; DIFFRACTION; ELEMENTS; EMISSION; ENERGY; METALS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SECONDARY EMISSION; SEPARATION PROCESSES; SORPTION; SURFACE PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; TUNGSTEN COMPOUNDS