Published September 24, 2008 | Version v1
Journal article Metadata-only

Potential of interferometric cantilever detection and its application for SFM/AFM in liquids

Creators

  • 1. London Centre for Nanotechnology and Department of Physics and Astronomy, University College London, 17-19 Gordon Street, London WC1H 0AH (United Kingdom)
  • 2. M E Mueller Institute, Biozentrum, University of Basel, Klingelbergstrasse 70, 4056 Basel (Switzerland)
  • 3. Institute of Biochemistry and Molecular Medicine, University of Berne, Buehlstrasse 28, 3012 Berne (Switzerland)
  • 4. Swiss Federal Laboratories for Materials Testing and Research, EMPA, Ueberlandstrasse 129, 8600 Duebendorf (Switzerland)

Description

We have developed an optical cantilever deflection detector with a spot size <3 μm and fm Hz-1/2 sensitivity over a>10 MHz bandwidth. In this work, we demonstrate its potential for detecting small-amplitude oscillations of various flexural and torsional oscillation modes of cantilevers. The high deflection sensitivity of the interferometer is particularly useful for detecting cantilever oscillations in aqueous solutions, enabling us to reach the thermal noise limit in scanning or atomic force microscopy experiments with stiff cantilevers. This has resulted in atomic-resolution images of solid-liquid interfaces and submolecular-resolution images of native membranes

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/19/38/384019

Additional details

Identifiers

DOI
10.1088/0957-4484/19/38/384019;
PII
S0957-4484(08)76171-3;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
19
Journal Issue
38
Journal Page Range
[6 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39113008
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
AQUEOUS SOLUTIONS; ATOMIC FORCE MICROSCOPY; DETECTION; IMAGES; INTERFEROMETERS; MHZ RANGE 01-100; NANOSTRUCTURES; OSCILLATION MODES; OSCILLATIONS; SENSITIVITY; SOLIDS
Descriptors DEC
DISPERSIONS; FREQUENCY RANGE; HOMOGENEOUS MIXTURES; MEASURING INSTRUMENTS; MHZ RANGE; MICROSCOPY; MIXTURES; SOLUTIONS