Published February 2012 | Version v1
Journal article

In situ micro-cantilever tests to study fracture properties of NiAl single crystals

  • 1. Department of Materials Science and Engineering, Institute I: General Materials Properties, Friedrich-Alexander-University of Erlangen-Nuremberg (Germany)

Description

In situ micro-cantilever tests were carried out to determine the anisotropic fracture toughness of NiAl single crystals. Notched micro-cantilever beams with a beam length of 8 μm, 1.5 μm thickness and 1.8 μm width were milled in so-called "hard" and "soft" orientations of NiAl using a focused ion beam. These cantilevers were loaded in situ with the help of a cantilever-based nanoindenter mounted inside a scanning electron microscope. A fracture toughness of 3.52 ± 0.29 MPa m1/2 was obtained for the "soft" orientation and 5.12 ± 0.50 MPa m1/2 for the "hard" orientation, which is in good agreement with literature values on the fracture toughness of macroscopic NiAl specimens. Furthermore, nanoindentations were performed for studying the size effects occurring at small length scales for both orientations. The applicability of the small sample geometries for testing the fracture toughness is finally discussed in terms of size effects in the flow stress of the material due to dislocation nucleation and strain gradients at the crack tip.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2011.10.060

Additional details

Identifiers

DOI
10.1016/j.actamat.2011.10.060;
PII
S1359-6454(11)00775-0;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
60
Journal Issue
3
Journal Page Range
p. 1193-1200
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43114888
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANISOTROPY; CRACKS; DISLOCATIONS; FLOW STRESS; FRACTURE PROPERTIES; ION BEAMS; MONOCRYSTALS; SCANNING ELECTRON MICROSCOPY; THICKNESS
Descriptors DEC
BEAMS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIMENSIONS; ELECTRON MICROSCOPY; LINE DEFECTS; MECHANICAL PROPERTIES; MICROSCOPY; STRESSES

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.