In situ micro-cantilever tests to study fracture properties of NiAl single crystals
Creators
- 1. Department of Materials Science and Engineering, Institute I: General Materials Properties, Friedrich-Alexander-University of Erlangen-Nuremberg (Germany)
Description
In situ micro-cantilever tests were carried out to determine the anisotropic fracture toughness of NiAl single crystals. Notched micro-cantilever beams with a beam length of 8 μm, 1.5 μm thickness and 1.8 μm width were milled in so-called "hard" and "soft" orientations of NiAl using a focused ion beam. These cantilevers were loaded in situ with the help of a cantilever-based nanoindenter mounted inside a scanning electron microscope. A fracture toughness of 3.52 ± 0.29 MPa m1/2 was obtained for the "soft" orientation and 5.12 ± 0.50 MPa m1/2 for the "hard" orientation, which is in good agreement with literature values on the fracture toughness of macroscopic NiAl specimens. Furthermore, nanoindentations were performed for studying the size effects occurring at small length scales for both orientations. The applicability of the small sample geometries for testing the fracture toughness is finally discussed in terms of size effects in the flow stress of the material due to dislocation nucleation and strain gradients at the crack tip.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2011.10.060Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2011.10.060;
- PII
- S1359-6454(11)00775-0;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 60
- Journal Issue
- 3
- Journal Page Range
- p. 1193-1200
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43114888
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; CRACKS; DISLOCATIONS; FLOW STRESS; FRACTURE PROPERTIES; ION BEAMS; MONOCRYSTALS; SCANNING ELECTRON MICROSCOPY; THICKNESS
- Descriptors DEC
- BEAMS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIMENSIONS; ELECTRON MICROSCOPY; LINE DEFECTS; MECHANICAL PROPERTIES; MICROSCOPY; STRESSES
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.