Published August 1999 | Version v1
Report

Correction of some diagnostic x-ray spectra measured using CdZnTe detector

  • 1. Osaka Univ., Faculty of Medicine, Suita, Osaka (Japan)
  • 2. Fukui Univ. of Technology, Faculty of Engineering, Gakuen, Fukui (Japan)

Description

X-ray spectra have been directly measured using a low-efficiency CdZnTe (CZT) detector. Photon spectra produced by a single-phase 2-pulse diagnostic X-ray unit driven at 50-100kV and a few mA, mammographic X-ray unit at 25-32kV and 80mAs, and X-ray computed tomography scanner at 120kV and 3mA, have been analyzed. Since detected spectra do not coincide with a true photon spectra, a correction is applied. Monoenergetic response function and full energy peak efficiency for the CZT detector have been determined by an evaluation of spurious effects such as K-escape, coherent scattering and incoherent (Compton) scattering, using Monte Carlo method. The results obtained using the CZT detector agree with X-ray spectral data published by Bureau of Radiological Health (BRH) which was measured by using a Ge detector, and also agree with those obtained by an ionization chamber. Therefor CZT detector would be able to use for quality control and quality assurance of some diagnostic X-ray units. (J.P.N.)

Part of:
Radiation detectors and their uses

Additional details

Identifiers

Publishing Information

Imprint Title
Radiation detectors and their uses
Imprint Pagination
190 p.
Journal Page Range
p. 145-154
Report number
KEK-PROC--99-8

Conference

Title
13. workshop on radiation detectors and their uses
Dates
8-10 Feb 1999
Place
Tsukuba, Ibaraki (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
31047913
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
CDTE SEMICONDUCTOR DETECTORS; CORRECTIONS; GAMMA SPECTRA; QUALITY ASSURANCE; RESPONSE FUNCTIONS; SPECTRA UNFOLDING; X-RAY SPECTRA; X-RAY SPECTROSCOPY
Descriptors DEC
DATA PROCESSING; FUNCTIONS; MEASURING INSTRUMENTS; PROCESSING; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROSCOPY

Optional Information

Notes
7 refs., 11 figs.