Correction of some diagnostic x-ray spectra measured using CdZnTe detector
Creators
- 1. Osaka Univ., Faculty of Medicine, Suita, Osaka (Japan)
- 2. Fukui Univ. of Technology, Faculty of Engineering, Gakuen, Fukui (Japan)
Description
X-ray spectra have been directly measured using a low-efficiency CdZnTe (CZT) detector. Photon spectra produced by a single-phase 2-pulse diagnostic X-ray unit driven at 50-100kV and a few mA, mammographic X-ray unit at 25-32kV and 80mAs, and X-ray computed tomography scanner at 120kV and 3mA, have been analyzed. Since detected spectra do not coincide with a true photon spectra, a correction is applied. Monoenergetic response function and full energy peak efficiency for the CZT detector have been determined by an evaluation of spurious effects such as K-escape, coherent scattering and incoherent (Compton) scattering, using Monte Carlo method. The results obtained using the CZT detector agree with X-ray spectral data published by Bureau of Radiological Health (BRH) which was measured by using a Ge detector, and also agree with those obtained by an ionization chamber. Therefor CZT detector would be able to use for quality control and quality assurance of some diagnostic X-ray units. (J.P.N.)
Additional details
Identifiers
- URL
- http://www.kek.jp;
Publishing Information
- Imprint Title
- Radiation detectors and their uses
- Imprint Pagination
- 190 p.
- Journal Page Range
- p. 145-154
- Report number
- KEK-PROC--99-8
Conference
- Title
- 13. workshop on radiation detectors and their uses
- Dates
- 8-10 Feb 1999
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 31047913
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- CDTE SEMICONDUCTOR DETECTORS; CORRECTIONS; GAMMA SPECTRA; QUALITY ASSURANCE; RESPONSE FUNCTIONS; SPECTRA UNFOLDING; X-RAY SPECTRA; X-RAY SPECTROSCOPY
- Descriptors DEC
- DATA PROCESSING; FUNCTIONS; MEASURING INSTRUMENTS; PROCESSING; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- 7 refs., 11 figs.