Published April 2008 | Version v1
Journal article

Ion beam modification studies of InP based multi quantum wells

  • 1. School of Physics, University of Hyderabad, Central University (P.O.), Hyderabad 500 046 (India)
  • 2. Soltan Institute of Nuclear Studies, 05-400 Swierk/Otwock (Poland)
  • 3. Institute of Electronic Materials Technology, ul. Wolczynska 133, 01-919 Warsaw (Poland)
  • 4. Inter University Accelerator Centre, P.O. Box 10502, Aruna Asaf Ali Marg, New Delhi 110 067 (India)
  • 5. Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 602 103 (India)
  • 6. Tata Institute of Fundamental Research, Homibhabha Road, Colaba, Mumbai 400 005 (India)

Description

Effects of heavy ion irradiation on InP based structures have been discussed. In specific, recent results on heavy ion irradiation of InP and InGaAs/InP multi quantum wells have been studied as a function of incident ion fluence and electronic energy loss. Studies involve photoluminescence (PL), high resolution X-ray diffraction (HRXRD), raman spectroscopy (RS) and atomic force microscopy (AFM). The heavy ion induced modifications in InP have been analyzed and damage creation has been correlated with a possible mechanisms. Multi quantum wells were investigated before and after irradiation and band gap engineering has been demonstrated using swift heavy ions for the first time. Band gap shift as a function of incident ion fluence has been observed and a maximum shift of 82 nm for a fluence of 1 x 1013 ions/cm2 has been reported. Possible applications in optoelectronic devices are highlighted

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2007.12.106

Additional details

Identifiers

DOI
10.1016/j.nimb.2007.12.106;
PII
S0168-583X(08)00026-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
266
Journal Issue
8
Journal Page Range
p. 1810-1815
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
18. international conference on ion beam analysis
Dates
23-28 Sep 2007
Place
Hyderabad (India)

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.