Published February 7, 2011
| Version v1
Journal article
Photoemission study of praseodymia in its highest oxidation state: The necessity of in situ plasma treatment
Creators
- 1. Institute of Applied and Physical Chemistry, University of Bremen, Leobener Str. NW2, D-28359 Bremen (Germany)
- 2. Department of Physics, University of Osnabrueck, Barbarastr. 7, D-49069 Osnabrueck (Germany)
- 3. IHP, Im Technologiepark 25, D-15236 Frankfurt (Oder) (Germany)
- 4. Institute of Solid State Physics, University of Bremen, P.O. Box 330440, D-28334 Bremen (Germany)
Description
A cold radio frequency oxygen plasma treatment is demonstrated as a successful route to prepare clean, well-ordered, and stoichiometric PrO2 layers on silicon. High structural quality of these layers is shown by x-ray diffraction. So far unobserved spectral characteristics in Pr 3d x-ray photoelectron (XP) spectra of PrO2 are presented as a fingerprint for praseodymia in its highest oxidized state. They provide insight in the electronic ground state and the special role of praseodymia among the rare earth oxides. They also reveal that former XP studies suffered from a significant reduction at the surface.
Additional details
Identifiers
- DOI
- 10.1063/1.3516953;
Publishing Information
- Journal Title
- Journal of Chemical Physics
- Journal Volume
- 134
- Journal Issue
- 5
- Journal Page Range
- p. 054701-054701.7
- ISSN
- 0021-9606
- CODEN
- JCPSA6
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43037538
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- GROUND STATES; HETEROJUNCTIONS; LAYERS; OXYGEN; PHOTOEMISSION; PLASMA; PRASEODYMIUM OXIDES; RADIOWAVE RADIATION; RARE EARTHS; REDUCTION; SEMICONDUCTOR MATERIALS; SILICON; STOICHIOMETRY; SURFACES; THIN FILMS; X RADIATION; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; ENERGY LEVELS; FILMS; IONIZING RADIATIONS; MATERIALS; METALS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PRASEODYMIUM COMPOUNDS; RADIATIONS; RARE EARTH COMPOUNDS; SCATTERING; SECONDARY EMISSION; SEMICONDUCTOR JUNCTIONS; SEMIMETALS; SPECTROSCOPY
Optional Information
- Notes
- (c) 2011 American Institute of Physics