Published December 15, 2008 | Version v1
Journal article

Assessment of the Nd/U ratio for the quantification of neodymium in UO2

  • 1. CEA Cadarache, DEN/DEC/SA3C/L2EC, 13108 Saint-Paul-lez-Durance (France)
  • 2. European Commission, Joint Research Centre, Institute for Transuranium Elements, P.O. Box 2340, DE-76125 Karlsruhe (Germany)
  • 3. PSI, 5232 Villingen (Switzerland)
  • 4. Ecole des Mines de Paris, 35 rue Saint-Honore, 77305 Fontainebleau Cedex 1 (France)

Description

The secondary ion energy spectrum of uranium depends on the experimental conditions, which is a problem for the application of a relative sensitivity factor (RSF) procedure for the measurement of the Nd concentration in UO2. This is interpreted as due to the dependence of the sputtering and ionisation yields of uranium on the oxidation state of the surface. Three experimental procedures are being tested to cope with this difficulty.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.05.196

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.05.196;
PII
S0169-4332(08)01008-8;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
255
Journal Issue
4
Journal Page Range
p. 863-865
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
16. international conference on secondary ion mass spectrometry
Acronym
SIMS 16
Dates
29 Oct - 2 Nov 2007
Place
Ishikawa Ongakudo, Kanazawa (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41009269
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ENERGY SPECTRA; ION MICROPROBE ANALYSIS; IONIZATION; IONS; MASS SPECTROSCOPY; NEODYMIUM; SPUTTERING; SURFACES; URANIUM; URANIUM DIOXIDE
Descriptors DEC
ACTINIDE COMPOUNDS; ACTINIDES; CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELEMENTS; METALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; RARE EARTHS; SPECTRA; SPECTROSCOPY; URANIUM COMPOUNDS; URANIUM OXIDES

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.