Published February 15, 2013 | Version v1
Journal article

Probing organic nanostructures by photoelectron-emission microscopy

  • 1. Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria)

Description

Photoelectron-emission microscopy (PEEM) is a very versatile tool for studying dynamic processes like growth and phase transitions on surfaces. Here we have applied PEEM to the growth of α-sexithiophene (α-6T) on Ag(1 1 0) surfaces to study the formation of the wetting layer and the initial stage of 3D growth. In this paper we want to point out how different light sources available in the lab can be used to obtain complementary information. We will also discuss the use of linear polarized light (Hg lamp) in this context.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2012.04.157

Additional details

Identifiers

DOI
10.1016/j.apsusc.2012.04.157;
PII
S0169-4332(12)00811-2;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
267
Journal Page Range
p. 26-29
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
11. international conference on atomically controlled surfaces, interfaces and nanostructures
Dates
3-7 Oct 2011
Place
St. Petersburg (Russian Federation)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46002796
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANISOTROPY; EMISSION SPECTROSCOPY; INTERFACES; LAYERS; LIGHT SOURCES; NANOSTRUCTURES; ORGANIC MATTER; PHASE TRANSFORMATIONS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PHOTONS; POLARIZATION; SILVER; SURFACES; THIN FILMS
Descriptors DEC
BOSONS; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; FILMS; MASSLESS PARTICLES; MATTER; METALS; RADIATION SOURCES; SECONDARY EMISSION; SPECTROSCOPY; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.