Published September 2021 | Version v1
Journal article

Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets

  • 1. University of Geneva, Department of Quantum Matter Physics, Geneva, 1204 (Switzerland)

Description

Highlights: • Hystorian streamlines data processing and archiving for research. • Proprietary file formats convert to HDF5 while preserving physical metadata. • Wrapper functions maximise ease of use for different workflows. • In-built functions simplify scanning probe microscopy and x-ray diffraction analysis. Research in materials science increasingly depends on the correlation of information from multiple characterisation techniques, acquired in ever larger datasets. Efficient methods of processing and storing these complex datasets are therefore crucial. Reliably keeping track of data processing is also essential to conform with the goals of open science. Here, we introduce Hystorian, a generic materials science data analysis Python package built at its core to improve the traceability, reproducibility, and archival ability of data processing. Proprietary data formats are converted into open hierarchical data format (HDF5) files, with both datasets and subsequent workflows automatically stored into a single location, thus allowing easy management of multiple data types. At present, Hystorian provides a basic scanning probe microscopy and x-ray diffraction analysis toolkit, and is readily extensible to suit user needs. It is also able to wrap over any existing processing functions, making it easy to append in an extant workflow.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2021.113345

Additional details

Identifiers

DOI
10.1016/j.ultramic.2021.113345;
PII
S0304399121001273;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
228
Journal Page Range
vp.
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54112315
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S97: MATHEMATICAL METHODS AND COMPUTING;
Descriptors DEI
DATA ANALYSIS; MATERIALS; MICROSCOPY; PYTHON; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DATA PROCESSING; DIFFRACTION; PROCESSING; PROGRAMMING LANGUAGES; SCATTERING

Optional Information

Copyright
Copyright (c) 2021 The Authors. Published by Elsevier B.V.