Published May 11, 2013 | Version v1
Journal article

Performance of the APS optical slope measuring system

  • 1. Advanced Photon Source, Argonne National Laboratory, 9700S. Cass Avenue, Argonne, 60439 (United States)

Description

An optical slope measuring system (OSMS) was recently brought into operation at the Advanced Photon Source of the Argonne National Laboratory. This system is equipped with a precision autocollimator and a very accurate mirror-based pentaprism on a scanning stage and kept in an environment-controlled enclosure. This system has the capability to measure precision optics with sub-microradian rms slope errors as documented with a series of tests demonstrating accuracy, stability, reliability and repeatability. Measurements of a flat mirror with 0.2 μrad rms slope error are presented which show that the variation of the slope profile measurements with the mirror setting at different locations along the scanning direction is only 60 nrad and the corresponding height error profile has 2 nm rms. -- Highlights: ► This is the first time to present the APS OSMS in publication. ► The APS OSMS is capable to measure flat and near flat mirrors with slope error <100 nrad rms. ► The accuracy of the slope error measurements of a 350 mm long mirror is less than 60 nrad rms

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2012.10.102

Additional details

Identifiers

DOI
10.1016/j.nima.2012.10.102;
PII
S0168-9002(12)01273-9;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
710
Journal Page Range
p. 48-51
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
4. international workshop on metrology for X-ray optics, mirror design, and fabrication
Dates
4-6 Jul 2012
Place
Barcelona (Spain)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45047646
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; ADVANCED PHOTON SOURCE; COLLIMATORS; ERRORS; MEASURING METHODS; MIRRORS; OPERATION; OPTICS; PERFORMANCE; RELIABILITY; STABILITY; VARIATIONS
Descriptors DEC
RADIATION SOURCES; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.