Atomic displacement parameters for Ni(ND3)4(NO2)2 from 9 K X-ray and 13 K time-of-flight neutron diffraction data
- 1. Aarhus Univ. (Denmark). Dept. of Chemistry
- 2. Western Australia Univ., Nedlands. Dept. of Chemistry
- 3. Australian National Univ., Canberra, ACT (Australia). Research School of Chemistry
- 4. Argonne National Lab., IL (United States). Intense Pulsed Neutron Source (IPNS) Program
Description
Structural parameters derived from 9 (1) K X-ray diffraction data and 13 (1) K time-of-flight neutron diffraction data on perdeuterated tetraamminedinitronickel(II), Ni(ND3)4(NO2)2, are compared. It is shown that excellent agreement can be obtained for both positional and thermal parameters derived separately from the two experiments, provided that great care is taken in all steps of the process, including data collection, data reduction, and nuclear and electronic structure refinement. The mean difference in the thermal parameters, left angle vertical stroke ΔUij vertical stroke right angle, is as low as 0.00034 A2 and left angle (ΔUij/σ)2 right angle 1/2 = 1.92, showing that, even without any form of scaling between the parameters, the same values can be obtained. This compared with other such studies, indicates that time-of-flight neutron diffraction data can give structural information of a quality comparable to monochromatic neutron diffraction. The excellent correspondence between the thermal parameters derived separately from X-ray and neutron diffraction data gives confidence in the deconvolution of the thermal motion from the X-ray diffraction data, which is necessary for any study of a static electron density distribution. (orig.)
Additional details
Publishing Information
- Journal Title
- Acta Crystallographica. Section B: Structural Science
- Journal Volume
- 52
- Journal Issue
- 6
- Journal Page Range
- p. 923-931.
- ISSN
- 0108-7681
- CODEN
- ASBSDK
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 28024958
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMMONIUM COMPOUNDS; CRYSTAL STRUCTURE; DEUTERIUM COMPOUNDS; NEUTRON DIFFRACTION; NICKEL COMPOUNDS; NITRATES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; HYDROGEN COMPOUNDS; NITROGEN COMPOUNDS; OXYGEN COMPOUNDS; SCATTERING; TRANSITION ELEMENT COMPOUNDS