Published October 15, 1973 | Version v1
Journal article Metadata-only

Thin dE/dx detectors of uniform thickness made on epitaxial silicon

Creators

  • 1. Centre National de la Recherche Scientifique, 67 - Strasbourg (France). Lab. de Physique des Rayonnements et d'Electronique Nucleaire
  • 2. Clermont-Ferrand Univ., 63 (France). Lab. de Physique Nucleaire

Description

no abstract available

Additional details

Identifiers

DOI
10.1016/0029-554x(73)90163-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
112
Journal Issue
3
Series
Nucl. Instrum. Methods.
Journal Page Range
465-467
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
5115530
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ANODES; DISSOLUTION; ELECTRIC CONDUCTIVITY; ENERGY SPECTRA; EPITAXY; FILMS; NITROGEN; NITROGEN IONS; SENSITIVITY; SILICON; SUBSTRATES; SURFACE BARRIER DETECTORS; THICKNESS
Descriptors DEC
CHARGED PARTICLES; DIMENSIONS; ELECTRICAL PROPERTIES; ELECTRODES; ELEMENTS; IONS; MEASURING INSTRUMENTS; NONMETALS; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SPECTRA

Optional Information

Notes
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