Published April 5, 2005
| Version v1
Journal article
Synthesis, characterization and optical behaviour of vapour grown nano-crystalline Al-Cr-Fe-Mo thin films
- 1. Laboratoire de Science et Genie des Materiaux et de Metallurgie, UMR 7584, CNRS-INPL-UHP, Parc de Saurupt, ENSMN, 54042 Nancy Cedex (France)
- 2. Laboratoire de Physique des Materiaux, UMR 7556, CNRS-INPL-UHP, Parc de Saurupt, ENSMN, 54042 Nancy Cedex (France)
Description
Thermal evaporation process was employed in production of thin films of an Al-Cr-Fe-Mo alloy. Microstructural and chemical features were respectively evaluated by grazing X-ray diffraction, transmission electron microscopy and sputtered neutral mass spectroscopy. Solidification structures reveal a homogeneous nanosized (2-70 nm) granular morphology. Experimental synthesis parameters leading to films purely made of the known O1 approximant phase have been defined. The other films were made of two phase particles, i.e. O1 grains mixed with pure cubic aluminium grains. Optical reflectance of the O1 film over the infrared and visible wavelength domains is presented
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2004.08.085;
- PII
- S0925-8388(04)01178-8;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 391
- Journal Issue
- 1-2
- Journal Page Range
- p. 206-211
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37052267
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; CHROMIUM ALLOYS; DEPOSITION; EVAPORATION; IRON ALLOYS; MASS SPECTROSCOPY; MOLYBDENUM ALLOYS; MORPHOLOGY; NANOSTRUCTURES; SOLIDIFICATION; SYNTHESIS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAPORS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; FLUIDS; GASES; MICROSCOPY; PHASE TRANSFORMATIONS; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.