Published October 2003 | Version v1
Miscellaneous Metadata-only

A new horizontal and vertical PIXE course in air at T.I.T. Van de Graaff laboratory

Creators

  • 1. Tokyo Inst. of Technology, Graduate School of Science and Engineering, Tokyo (Japan)
  • 2. Tokyo Inst. of Technology, Dept. of Energy Sciences, Tokyo (Japan)
  • 3. Tokyo Inst. of Technology, Research Laboratory for Nuclear Reactors, Tokyo (Japan)

Description

Already there is a horizontal beam course for PIXE at atmosphere in Van de Graaff laboratory at Tokyo Institute of Technology. This course setting is being changed to other different type by each experiment, though it was difficult to perform experiment with good reproducible result. In addition we couldn't detect liquid samples. Therefore we constructed a new PIXE course which was able to detected solid and liquid samples, when an analyzer magnet was renewed. The purpose of a new PIXE course is high-level reproducibility on horizontal beam and determination of many liquid samples, for example environment assessment, in a short period of time. We will report about a new PIXE course and measurements that are used it. (author)

Part of:
Proceedings of the fifth symposium on accelerator and related technology for application

Additional details

Publishing Information

Imprint Title
Proceedings of the fifth symposium on accelerator and related technology for application
Imprint Pagination
98 p.
Journal Page Range
p. 3-4

Conference

Title
5. symposium on accelerator and related technology for application
Acronym
ARTA 2003
Dates
21-22 Oct 2003
Place
Tokyo (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
41054814
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
AIR; ALIGNMENT; ATMOSPHERES; BEAM OPTICS; BEAM PROFILES; CONSTRUCTION; ENVIRONMENTAL QUALITY; LIQUIDS; MAGNETS; PIXE ANALYSIS; SOLIDS; VAN DE GRAAFF ACCELERATORS
Descriptors DEC
ACCELERATORS; CHEMICAL ANALYSIS; ELECTROSTATIC ACCELERATORS; EQUIPMENT; FLUIDS; GASES; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
3 figs.