Published February 4, 2010 | Version v1
Journal article

Chemically deposited tin sulphide

  • 1. Institut d'Electronique du Sud, Unite Mixte de Recherche 5214 UM2-CNRS (ST2i), Universite Montpellier 2, Place Eugene Bataillon, CC 082, 34095 Montpellier Cedex 5 (France)
  • 2. Laboratoire de Physique de la Matiere Condensee, Faculte des Sciences de Tunis El Manar, Tunisie 2092 (Tunisia)

Description

SnS thin films were deposited on glass substrates after multi-deposition runs by chemical bath deposition from aqueous solution containing 30 ml triethanolamine (TEA) (C6H15NO3) (50%), 10 ml thioacetamide (CH3CSNH2), 8 ml ammonia (NH3) solution and 10 ml of Sn2+(0.1 M). These films were characterised with X-ray diffraction (XRD), with scanning electron microscopy, and with spectrophotometric measurements. The obtained thin films exhibit the zinc blend structure, the crystallinity seems to be improved as the film thickness increases and the band gap energy is found to be about 1.76 eV for film prepared after six depositions runs.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2009.08.140

Additional details

Identifiers

DOI
10.1016/j.jallcom.2009.08.140;
PII
S0925-8388(09)01537-0;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
490
Journal Issue
1-2
Journal Page Range
p. 180-183
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.