Published February 4, 2010
| Version v1
Journal article
Chemically deposited tin sulphide
Creators
- 1. Institut d'Electronique du Sud, Unite Mixte de Recherche 5214 UM2-CNRS (ST2i), Universite Montpellier 2, Place Eugene Bataillon, CC 082, 34095 Montpellier Cedex 5 (France)
- 2. Laboratoire de Physique de la Matiere Condensee, Faculte des Sciences de Tunis El Manar, Tunisie 2092 (Tunisia)
Description
SnS thin films were deposited on glass substrates after multi-deposition runs by chemical bath deposition from aqueous solution containing 30 ml triethanolamine (TEA) (C6H15NO3) (50%), 10 ml thioacetamide (CH3CSNH2), 8 ml ammonia (NH3) solution and 10 ml of Sn2+(0.1 M). These films were characterised with X-ray diffraction (XRD), with scanning electron microscopy, and with spectrophotometric measurements. The obtained thin films exhibit the zinc blend structure, the crystallinity seems to be improved as the film thickness increases and the band gap energy is found to be about 1.76 eV for film prepared after six depositions runs.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2009.08.140Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2009.08.140;
- PII
- S0925-8388(09)01537-0;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 490
- Journal Issue
- 1-2
- Journal Page Range
- p. 180-183
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41121392
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMMONIA; AQUEOUS SOLUTIONS; CHEMICAL COATING; EV RANGE 01-10; SCANNING ELECTRON MICROSCOPY; SPECTROPHOTOMETRY; THIN FILMS; TIN IONS; TIN SULFIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DISPERSIONS; ELECTRON MICROSCOPY; ENERGY RANGE; EV RANGE; FILMS; HOMOGENEOUS MIXTURES; HYDRIDES; HYDROGEN COMPOUNDS; IONS; MICROSCOPY; MIXTURES; NITROGEN COMPOUNDS; NITROGEN HYDRIDES; SCATTERING; SOLUTIONS; SULFIDES; SULFUR COMPOUNDS; SURFACE COATING; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.