Published November 2011 | Version v1
Journal article Metadata-only

Auger electron spectroscopy analysis of chromium depletion in a model Ni-16Cr-9Fe alloy oxidized at 950 oC

Creators

  • 1. Ecole des Mines de Saint-Etienne, Laboratoire Claude Goux UMR CNRS 5146, Centre SMS, 158 Cours Fauriel, 42023 Saint Etienne (France)
  • 2. ENISE, UMR 5513, LTDS, Universite de Lyon, 54 Rue Jean Parot, 42023 Saint Etienne (France)
  • 3. AREVA NP, Centre Technique, Departement Corrosion-Chimie, 30 Bd de l'Industrie, 71200 Le Creusot (France)

Description

A complete chromium depletion profile with its depth resolution in the nanometre range was obtained on a Ni-16Cr-9Fe model alloy after a 10 h oxidation at 950 oC in air. Auger electron spectroscopy coupled to ion sputtering and energy-dispersive X-ray spectroscopy were used to measure the chromium depletion profile. The chromium content at the oxide/alloy interface is below 0.5 wt.%. This exceptionally low Cr content is in agreement with Wagner's model for binary alloys.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.scriptamat.2011.07.036

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2011.07.036;
PII
S1359-6462(11)00435-0;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
65
Journal Issue
9
Journal Page Range
p. 803-806
ISSN
1359-6462
CODEN
SCMAF7

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45024650
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
AUGER ELECTRON SPECTROSCOPY; BINARY ALLOY SYSTEMS; CHROMIUM; CHROMIUM ALLOYS; CRYSTAL MODELS; DIFFUSION; INTERFACES; IRON ALLOYS; NICKEL BASE ALLOYS; OXIDATION; OXIDES; RESOLUTION; SPUTTERING; X-RAY SPECTROSCOPY
Descriptors DEC
ALLOY SYSTEMS; ALLOYS; CHALCOGENIDES; CHEMICAL REACTIONS; ELECTRON SPECTROSCOPY; ELEMENTS; MATHEMATICAL MODELS; METALS; NICKEL ALLOYS; OXYGEN COMPOUNDS; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.