Published April 1996 | Version v1
Journal article

An integrated planar gradiometer based on a double relaxation oscillation SQUID

  • 1. Korea Research Institute of Standards and Science, PO Box 102, Yusong, Taejon, 305-600 (Korea, Republic of)

Description

The design and performance of an integrated planar gradiometer based on a double relaxation oscillation SQUID (DROS) are presented. The DROS was made from hysteretic Nb/AlOx/Nb junctions and the devices were fabricated by a simple four-level process. The signal SQUID loop is a gradiometric type with two square holes connected in parallel and a reference junction is used instead of the reference SQUID. The high flux-to-voltage transfer coefficient of typically 3 mV Φ0-1 enabled direct readout by a simple electronics with a modest voltage noise. The pickup coil integrated on the same wafer as the SQUID consists of two planar 10x10 mm2 coils connected in series and has a baseline of 30 mm. The overall size of the device 10x40 mm2 is . The field gradient noise is 2.6 fT cm-1 Hz-1/2 in the white region and 4.4 fT cm-1 Hz-1/2 at 1 Hz. (author)

Availability note (English)

Available online at the Web site for the journal Superconductor Science and Technology (ISSN 1361-6668) http://www.iop.org/

Additional details

Identifiers

Publishing Information

Journal Title
Superconductor Science and Technology
Journal Volume
9
Journal Issue
4A
Journal Page Range
p. A34-A37
ISSN
0953-2048

Conference

Title
ISEC '95 (International Superconductive Electronics Conference)
Dates
18-21 Sep 1995
Place
Nagoya (Japan)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
32005327
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM OXIDES; FABRICATION; NIOBIUM; SQUID DEVICES; SUPERCONDUCTING JUNCTIONS
Descriptors DEC
ALLOYS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUXMETERS; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; OXIDES; OXYGEN COMPOUNDS; REFRACTORY METALS; SUPERCONDUCTING DEVICES; TRANSITION ELEMENTS