Effect of seed layers on dynamic and static magnetic properties of Fe65Co35 thin films
Creators
- 1. Department of Engineering Sciences, Uppsala University, Box 534, SE-751 21 Uppsala (Sweden)
- 2. Seagate Technology, BT48 0BF, Londonderry (United Kingdom)
- 3. Department of Physics and Astronomy, Uppsala University, Box 516, SE-751 20 Uppsala (Sweden)
- 4. Department of Materials and Environmental Chemistry, Stockholm University, SE-106 91 Stockholm (Sweden)
Description
Fe65Co35 thin films have been deposited on SiO2 substrates using sputtering technique with different choices of seed layer; Ru, Ni82.5Fe17.5, Rh, Y and Zr. Best soft magnetic properties were observed with seed layers of Ru, Ni82.5Fe17.5 and Rh. Adding these seed layers, the coercivity of the Fe65Co35 films decreased to values of around 1.5 mT, which can be compared to the value of 12.5 mT obtained for films deposited without seed layer. Further investigations were performed on samples with these three seed layers in terms of dynamic magnetic properties, both on as prepared and annealed samples, using constant frequency cavity and broadband ferromagnetic resonance measurements. Damping parameters of around 8.0 10−3 and 4.5 10−3 were obtained from in-plane and out-of-plane measurements, respectively, for the as prepared samples, values that were reduced to about 6.5 10−3 and 4.0 10−3 for annealed samples. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6463/aaccc0Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 51
- Journal Issue
- 30
- Journal Page Range
- [9 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52054501
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; BINARY ALLOY SYSTEMS; COBALT COMPOUNDS; COERCIVE FORCE; COMPARATIVE EVALUATIONS; FERROMAGNETIC RESONANCE; IRON COMPOUNDS; LAYERS; MAGNETIC PROPERTIES; SILICON OXIDES; SPUTTERING; SUBSTRATES; THIN FILMS
- Descriptors DEC
- ALLOY SYSTEMS; CHALCOGENIDES; EVALUATION; FILMS; HEAT TREATMENTS; MAGNETIC RESONANCE; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RESONANCE; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS