Published February 14, 2013 | Version v1
Journal article

Atomic rearrangements in amorphous Al2O3 under electron-beam irradiation

  • 1. Department of Materials Science, Graduate School of Engineering, Osaka Prefecture University, Gakuen-cho 1-1, Naka-ku, Sakai 599-8531 (Japan)
  • 2. Institute of Scientific and Industrial Research, Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047 (Japan)
  • 3. Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Mihogaoka 7-1, Ibaraki, Osaka 567-0047 (Japan)

Description

The electron-irradiation-induced crystallization of amorphous Al2O3 (a-Al2O3) was investigated by in-situ transmission electron microscopy under the wide electron-energy region of 25–300 keV. The formation of γ-Al2O3 nanocrystallites was induced by irradiating the a-Al2O3 thin film along with the formation of nanovoids in the crystalline grains regardless of the acceleration voltage. The crystallization became more pronounced with decreasing the electron energy, indicating that electronic excitation processes play a dominant role in the formation of γ-Al2O3. Radial distribution analyses suggested that a-Al2O3 transforms to γ-phase via the "excited" ("stimulated") amorphous state, in which the breaking and rearrangement of unstable short-range Al-O bonds, i.e., fivefold-coordinated Al-O (AlO5) basic units, occur.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
113
Journal Issue
6
Journal Page Range
p. 064312-064312.7
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2013 American Institute of Physics