Published April 2018 | Version v1
Journal article

Influence of nitrogen pre-irradiation at different temperatures on surface blistering and deuterium retention in tungsten

  • 1. Beijing Key Laboratory of Advanced Nuclear Materials and Physics, Beihang University (China)
  • 2. School of Physics & Nuclear Energy Engineering, Beihang University, Beijing, 100191 (China)

Description

Highlights: • The blistering on tungsten surface by deuterium implantation is suppressed by nitrogen pre-irradiation. • The deuterium retention in tungsten decreases largely due to the WNxs layer. • Temperature has a signally influence on the nitrogen irradiation. - Abstract: Nitrogen seeding is considered to be used to reduce the power load onto tungsten divertor armors in tokamaks. Consequently, plasma-material interactions will be affected by seeded nitrogen impurities. The influence of nitrogen pre-irradiation on deuterium induced blistering and deuterium retention in rolled tungsten has been investigated at different pre-irradiation temperatures in the linear plasma device STEP with ion flux >1021 m−2 s−1. Commercially rolled W samples were sequentially exposed to nitrogen plasma (380 K and 470 K) and deuterium plasma (510 K). Surface observations show that nitrogen pre-irradiation suppresses deuterium-induced surface blistering. Thermal desorption spectroscopy measurements indicate that deuterium retention in the rolled tungsten is reduced due to nitrogen pre-irradiation, and it significantly changes with the pre-irradiation temperature. These phenomena are supposed to be related to the formation and change of WNxs at different temperatures which is validated by X-ray photoelectron spectroscopy analyses.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.fusengdes.2018.02.002

Additional details

Identifiers

DOI
10.1016/j.fusengdes.2018.02.002;
PII
S0920379618301030;

Publishing Information

Journal Title
Fusion Engineering and Design
Journal Volume
129
Journal Page Range
p. 1-5
ISSN
0920-3796
CODEN
FEDEEE

Optional Information

Notes
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