Preliminary microdosimetric measurements with ultra-thin 3D silicon detectors of a 62 MeV proton beam
- 1. Department of Radiation Oncology, Perelman Center for Advanced Medicine, University of Pennsylvania, Philadelphia, PA 19104 (United States)
- 2. Instituto de Microelectrónica de Barcelona, Centro Nacional de Microelectrónica (IMB-CNM, CSIC), 08193 Bellaterra (Barcelona) (Spain)
- 3. Departamento de Física de Partículas, Facultad de Física, Universidad de Santiago de Compostela (USC), E-15782 Santiago de Compostela (Spain)
Description
In this paper we present the first direct microdosimetric measurements of 62 MeV proton beams using ultra-thin 3D silicon detectors at different depths in a solid-water phantom. The detectors have 3D columnar electrodes that penetrate a 10 μm thick silicon membrane, resulting in a micrometric scale sensitive volume. The 62 MeV proton beam was generated in a cyclotron CYCLONE-110 at Centre de Recherches du Cyclotron (CRC) at Louvain-la-Neuve. The proton beam average energy was modulated with stacked tissue-equivalent solid water layers. The energy loss profile was studied through the Bragg curve and pulse height spectra. The experimental silicon microdosimetric spectra showed the lineal energy dependence along the Bragg curve. This work demonstrates the potential capability of the ultra-thin 3D silicon detectors as 3D detector technology-based microdosimeters
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/10/01/P01008Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 10
- Journal Issue
- 01
- Journal Page Range
- p. P01008
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46042299
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BRAGG CURVE; CYCLOTRONS; ENERGY DEPENDENCE; ENERGY LOSSES; MEV RANGE 10-100; PHANTOMS; PROTON BEAMS; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- ACCELERATORS; BEAMS; CYCLIC ACCELERATORS; DIAGRAMS; ENERGY RANGE; INFORMATION; LOSSES; MEASURING INSTRUMENTS; MEV RANGE; MOCKUP; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; STRUCTURAL MODELS