Published November 2019 | Version v1
Journal article

Quantitative analysis of electron channeling contrast of dislocations

  • 1. Research Center for Strategic Materials, National Institute for Materials Science, Tsukuba, Ibaraki, 305-0047 (Japan)

Description

Highlights: • Quantitative analysis of electron channeling contrast (ECC) of dislocations from a series of ECC images taken as a function of sample tilt at ∼ 0.1° increments across < 200> Kikuchi lines performed by an EBSD-based ECCI approach. • Evaluation of dislocation contrast by quantitative analysis of the variation of experimental imaging parameters, namely, dislocation contrast intensity and dislocation feature width, with the deviation parameter, w. • Determination of the range of deviation parameter, w, for optimal dislocation imaging. -- Abstract: Quantitative analysis was performed for electron channeling contrast (ECC) of dislocations in a [001] single-crystal 316 L stainless steel sample in order to establish the range of deviation parameter, w, for optimal dislocation imaging. Channeling contrast was evaluated from a series of ECC images taken as a function of sample tilt at ∼ 0.1° increments across 200 Kikuchi lines. The deviation parameter, w, was estimated by quantitative analysis of several parameters, namely experimental dislocation contrast intensity and dislocation feature width, as well as calculated BSE signal. Our analysis reveals that optimum dislocation imaging conditions by ECC occur for positive values of w. Under these imaging conditions, dislocations displayed strong contrast and narrow dislocation feature width, y. In particular, we found that the value of y can be greatly reduced (about two times in the present work) by using large positive values of w (w > 1.0 ± 0.5). Out of these channeling conditions, dislocations displayed weak contrast and larger y-values were measured.

Additional details

Identifiers

DOI
10.1016/j.ultramic.2019.112826;
PII
S0304399118303279;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
206
Journal Page Range
vp.
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55044156
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
BACKSCATTERING; ELECTRON DIFFRACTION; MONOCRYSTALS; SCANNING ELECTRON MICROSCOPY; SIGNALS
Descriptors DEC
COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; SCATTERING

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.