Rotation axes analysis of deformed magnesium based on rotation contour contrast in a scanning electron microscope
Creators
Description
A crystallographic orientation contrast in the form of cross-shaped and intersecting contours was observed in a backscattered electron (BSE) micrograph of deformed magnesium (Mg) grains in a cold field emission scanning electron microscope (CFE-SEM). This contrast was identified as rotation contour contrast (RCC). A model is presented to link the RCC in the BSE micrograph to the channeling contrast in the corresponding channeling pattern. Based on this model, the appearance of the cross-shaped RCC in the BSE micrograph was attributed to the rotation of the crystal about two rotation axes and the RCC was related to a two dimensional angular scan of the corresponding channeling pattern. This model was experimentally validated using the selected area channeling pattern (SACP) technique. The crystallographic directions of the rotation axes were identified using the electron backscatter diffraction (EBSD) technique. - Highlights: • The rotation contour contrast (RCC) was studied in scanning electron microscope (SEM). • The RCC model was developed to link the backscattered electron contrast to the channeling contrast. • The RCC model was validated using the selected area channeling pattern (SACP). • The rotation axes were identified using the electron backscatter diffraction (EBSD)
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2015.03.008Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2015.03.008;
- PII
- S0304-3991(15)00051-0;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 154
- Journal Page Range
- p. 42-48
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47038205
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BACKSCATTERING; CRYSTALLOGRAPHY; CRYSTALS; ELECTRON CHANNELING; ELECTRON DIFFRACTION; FIELD EMISSION; GRAIN ORIENTATION; ROTATION; SCANNING ELECTRON MICROSCOPY; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- CHANNELING; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION; MICROSCOPY; MICROSTRUCTURE; MOTION; ORIENTATION; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.