Published January 15, 1988
| Version v1
Journal article
Effect of oxygen incorporation on the structure of ion-beam-assisted LaF3 thin films
- 1. Air Force Institute of Technology, Department of Engineering Physics, Wright-Patterson Air Force Base, Ohio 45433
Description
The percentage of oxygen in the crystalline lattice of ion-assisted-deposition Lanthanum fluorides is shown to increase with increasing ion beam current density
Additional details
Publishing Information
- Journal Title
- Appl. Opt.
- Journal Volume
- 27
- Journal Issue
- 2
- Series
- Appl. Opt.
- Journal Page Range
- 213-215
- ISSN
- 0003-6935
- CODEN
- APOPA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 19049493
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CHEMICAL COMPOSITION; DEPOSITION; ION BEAMS; LANTHANUM FLUORIDES; SURFACE COATING; THIN FILMS; VACUUM EVAPORATION; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; DIFFRACTION; EVAPORATION; FILMS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; LANTHANUM COMPOUNDS; PHASE TRANSFORMATIONS; RARE EARTH COMPOUNDS; SCATTERING