Published June 11, 2015 | Version v1
Journal article Metadata-only

In situ analysis of electrocrystallization process of metal electrodeposition with confocal energy dispersive X-ray diffraction based on polycapillary X-ray optics

Creators

  • 1. Beijing Radiation Center, Beijing 100875 (China)
  • 2. College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China)
  • 3. The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China)
  • 4. Center for Disease Control and Prevention of Beijing, Beijing 100013 (China)

Description

The confocal energy dispersive X-ray diffraction (EDXRD) based on a polycapillary focusing X-ray lens (PFXRL) in excitation channel and a polycapillary parallel X-ray lens (PPXRL) in detection channel was presented to study the electrocrystallization process of metal electrodeposition. The input focal spot of the PPXRL and the output focal spot of the PFXRL was adjusted in a confocal configuration, and only the X-rays from the volume overlapped by the two foci could be accordingly detected by the detector. The experimental results demonstrated the confocal EDXRD could be used to in situ real-time analysis of electrochemical crystal growth process

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2015.03.015

Additional details

Identifiers

DOI
10.1016/j.nima.2015.03.015;
PII
S0168-9002(15)00309-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
785
Journal Page Range
p. 201-205
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47027580
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CRYSTAL GROWTH; ELECTROCHEMISTRY; ELECTRODEPOSITION; EXCITATION; FOCUSING; LENSES; METALS; OPTICS; X RADIATION; X-RAY DETECTION; X-RAY DIFFRACTION
Descriptors DEC
CHEMISTRY; COHERENT SCATTERING; DEPOSITION; DETECTION; DIFFRACTION; ELECTROLYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY-LEVEL TRANSITIONS; IONIZING RADIATIONS; LYSIS; RADIATION DETECTION; RADIATIONS; SCATTERING; SURFACE COATING

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.