Energy spectra and LET spectra of protons behind shielding
Creators
Description
With the advent of devices sensitive to SEU due to direct ionization by protons, it became important to know the flux and energies of protons behind aluminum shielding or within satellites. We present new analytically derived expressions for the energy distribution of incident protons, after passing the shielding, and of secondary protons emitted within the shielding. The results are compared with those of the MULASSIS code. In some cases, like a satellite in a GCR orbit, the contribution of the secondary protons to SEU might be the dominant one. Proton energy-distributions behind shielding are proportional, at low energy values, to inverse proton-LET in aluminum. Their calculated LET-spectra in silicon can be used for evaluating SEU-rate in space. The analytic expressions presented here can be useful in calculating the influence of shielding on other incident ions and secondary ions
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2014.04.015Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2014.04.015;
- PII
- S0168-583X(14)00517-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 333
- Journal Page Range
- p. 46-51
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46129029
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALUMINIUM; COMPARATIVE EVALUATIONS; ENERGY SPECTRA; INTERACTIONS; IONIZATION; IONS; LET; PROTON SPECTRA; PROTON TRANSPORT; PROTONS; SHIELDING; SILICON
- Descriptors DEC
- BARYONS; CHARGED PARTICLES; CHARGED-PARTICLE TRANSPORT; ELEMENTARY PARTICLES; ELEMENTS; ENERGY TRANSFER; EVALUATION; FERMIONS; HADRONS; METALS; NUCLEONS; RADIATION TRANSPORT; SEMIMETALS; SPECTRA
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.