Published 1981
| Version v1
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Ion-beam depth-profiling studies of leached glasses
Description
Ion-beam depth-profiling was carried out on three different glasses leached (or hydrated) in deionized water using 1H(19F,αγ)16O nuclear reaction, secondary ion mass spectrometry (SIMS) and sputter-induced photon spectrometry (SIPS) techniques. The depth-profiles show an interdiffusion mechanism in which the sodium ions in the glass are depleted and replaced by hydrogen (H+) or hydronium (H3O+) ions from the solution. The leaching behavior does not show significant difference whether the glass surface is fractured or polished. Problems of mobile ion migration caused by ion bombardment and loss of hydrogen during analysis are discussed
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01 as DE82018176.Files
14727251.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 19 p.
- Report number
- CONF-8106132--2
Conference
- Title
- International conference on radiation effects in glasses.
- Dates
- 30 Jun - 3 Jul 1981.
- Place
- Arco, Lago di Garda (Italy).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14727251
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL REACTIONS; GLASS; HYDROGEN IONS; ION BEAMS; LEACHING; SILICATES; SODIUM IONS; WATER
- Descriptors DEC
- ATOMIC IONS; BEAMS; CHARGED PARTICLES; DISSOLUTION; HYDROGEN COMPOUNDS; IONS; OXYGEN COMPOUNDS; SEPARATION PROCESSES; SILICON COMPOUNDS