Published June 1975 | Version v1
Report Metadata-only

Accurate measurement of noise parameters in ultra-low noise opto-feedback spectrometer systems

Creators

  • 1. California Univ., Berkeley (USA). Lawrence Berkeley Lab.

Description

The accurate measurement of the basic noise parameters of ultra-low noise spectrometer systems has been developed in the frequency domain by spectrum analysis. This method overcomes some of the difficulties experienced in using conventional techniques. An analytic and experimental comparison between 'time' and frequency domain techniques is carried out and the use of the latter as a method to develop extremely low-noise detector and FET packages is demonstrated. The origin of the remaining noise in high quality systems is traced to surface and gate junction generation through traps in the FET

Additional details

Publishing Information

Imprint Title
Proceedings 2nd Ispra nuclear electronics symposium. Stresa, Italy, May 20-23, 1975
Imprint Pagination
p. 47-65.
Report number
EUR--5370

Conference

Title
2. Ispra nuclear electronics symposium.
Dates
20 May 1975.
Place
Stresa, Italy.

INIS

Country of Publication
European Commission (EC), Brussels (Belgium)
Country of Input or Organization
European Commission (EC), Brussels (Belgium)
INIS RN
7249396
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AMPLIFIERS; BACKGROUND NOISE; ELECTRIC FILTERS; FEEDBACK; FREQUENCY DEPENDENCE; GE SEMICONDUCTOR DETECTORS; MATHEMATICAL MODELS; MEASURING METHODS; MOSFET; SPECTROMETERS; TIMING PROPERTIES
Descriptors DEC
FILTERS; MEASURING INSTRUMENTS; MOS TRANSISTORS; NOISE; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; TRANSISTORS