Published June 10, 2013
| Version v1
Journal article
Software for analysis of waveforms acquired by digital Doppler broadening spectrometer
Creators
- 1. Faculty of Mathematics and Physics, Charles University in Prague, V Holešovickách 2, Prague 8, CZ-18000 (Czech Republic)
Description
High-resolution digital spectrometer for coincidence measurement of Doppler broadening of positron annihilation radiation was recently developed and tested. In this spectrometer pulses from high purity Ge (HPGe) detectors are sampled in the real time by fast digitizers and subsequently analyzed off-line by software. We present description of the software routines used for pulse shape analysis in two spectrometer configurations: (i) semi-digital setup in which detector pulses shaped in spectroscopic amplifiers (SA's) are digitized; (ii) pure digital setup in which pulses from detector pre-amplifiers are digitized directly. Software developed in this work will be freely available in the form of source code and pre-compiled binaries.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/443/1/012087Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 443
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 16. international conference on positron annihilation
- Acronym
- ICPA-16
- Dates
- 19-24 Aug 2012
- Place
- Bristol (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44076424
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMPLIFIERS; ANNIHILATION; COMPUTER CODES; CONFIGURATION; DIGITIZERS; DOPPLER BROADENING; HIGH-PURITY GE DETECTORS; POSITRONS; PULSE SHAPERS; PULSES; SPECTROMETERS
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; GE SEMICONDUCTOR DETECTORS; INTERACTIONS; LEPTONS; LINE BROADENING; MATTER; MEASURING INSTRUMENTS; PARTICLE INTERACTIONS; PULSE CIRCUITS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SIGNAL CONDITIONERS