Published December 11, 2006
| Version v1
Journal article
Probing pairing symmetry of Sm1.85Ce0.15CuO4 via highly-sensitive voltage measurements: Evidence for strong impurity scattering
- 1. Grupo de Materiais e Dispositivos, Centro Multidisciplinar para o Desenvolvimento de Materiais Ceramicos, Departamento de Fisica, Universidade Federal de Sao Carlos, Caixa Postal 676, 13565-905 Sao Carlos, SP (Brazil)
- 2. Grupo de Materiais e Dispositivos, Centro Multidisciplinar para o Desenvolvimento de Materiais Ceramicos, Departamento de Fisica, Universidade Federal de Sao Carlos, Caixa Postal 676, 13565-905 Sao Carlos, SP (Brazil) and Joint Institute for Nuclear Research, Bogoliubov Laboratory of Theoretical Physics, 141980 Dubna, Moscow region (Russian Federation)
Description
Using a highly-sensitive home-made mutual-inductance technique, temperature profiles of the magnetic penetration depth λ(T) in the optimally-doped Sm1.85Ce0.15CuO4 thin films have been extracted. The low-temperature behavior of λ(T) is found to be best-fitted by linear Δλ(T)/λ(0)=ln(2)kBT/Δ0 and quadratic Δλ(T)/λ(0)=Γ-1/2Δ0-3/2T2 laws above and below T=0.22TC, respectively, which clearly indicates the presence of d-wave pairing mechanism dominated by strong paramagnetic scattering at the lowest temperatures. The best fits produce Δ0/kBTC=2.07 and Γ/TC=0.25(TC/Δ0)3 for the estimates of the nodal gap parameter and impurity scattering rate
Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2006.07.010;
- arXiv
- arXiv:cond-mat/0701455v1;
- PII
- S0375-9601(06)01091-7;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 359
- Journal Issue
- 6
- Journal Page Range
- p. 696-699
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38067350
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- CERIUM COMPOUNDS; COPPER OXIDES; D WAVES; DOPED MATERIALS; ELECTRIC POTENTIAL; ELECTRONS; IMPURITIES; INDUCTANCE; PARAMAGNETISM; PENETRATION DEPTH; SAMARIUM COMPOUNDS; SCATTERING; SUPERCONDUCTORS; SYMMETRY; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; COPPER COMPOUNDS; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; FERMIONS; FILMS; LEPTONS; MAGNETISM; MATERIALS; OXIDES; OXYGEN COMPOUNDS; PARTIAL WAVES; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.