Enhanced formation of nanowires and quantum dots on dislocated substrates
Creators
- 1. Institute of Problems of Mechanical Engineering, Russian Academy of Sciences, Bolshoj 61, Vasilyevsky Ostrov, St Petersburg 199178 (Russian Federation)
Description
A new mode of enhanced growth of semiconductor nanowires and quantum dots on mismatched substrates is suggested and theoretically examined. This mode is based on the effects of misfit dislocations located in a composite two-layer substrate on the epitaxial growth on the substrate surface. It is shown that stress fields of such dislocations are capable of essentially enhancing the formation of nanowires and quantum dots on dislocated substrates, compared to the conventional case of non-dislocated substrates. In particular, in certain ranges of parameters of heteroepitaxial systems, the growth of quantum dots and nanowires on non-dislocated substrates is forbidden, while their growth on dislocated substrates with the same parameters is energetically favourable
Availability note (English)
Available online at http://stacks.iop.org/0953-8984/16/2161/cm4_12_024.pdf or at the Web site for the Journal of Physics. Condensed Matter (ISSN 1361-648X) http://www.iop.org/Additional details
Identifiers
- URL
- http://stacks.iop.org/0953-8984/16/2161/cm4_12_024.pdf; http://www.iop.org/;
- DOI
- 10.1088/0953-8984/16/12/024;
- PII
- S0953-8984(04)68947-8;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 16
- Journal Issue
- 12
- Journal Page Range
- p. 2161-2170
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35104737
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CRYSTAL GROWTH; DISLOCATIONS; EPITAXY; LAYERS; QUANTUM DOTS; SEMICONDUCTOR MATERIALS; STRESSES; SUBSTRATES; SURFACES
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; EVALUATION; LINE DEFECTS; MATERIALS; NANOSTRUCTURES