Published October 20, 2008
| Version v1
Journal article
Thermoelectric properties of Al-doped Mg2Si1-xSnx (x ≤ 0.1)
Creators
- 1. Department of Electronic Materials, Osaka Municipal Technical Research Institute, 1-6-50 Morinomiya, Joto-ku, Osaka 536-8553 (Japan)
Description
The thermoelectric properties of Al-doped Mg2Si1-xSnx (x = 0.0-0.1) [Mg2Si1-xSnx:Al = 1:y (0.00 ≤ y ≤ 0.02)] fabricated by spark plasma sintering have been characterized by Hall effect measurements at 300 K and by measurements of electrical resistivity (ρ), the Seebeck coefficient (S), and thermal conductivity (κ) between 300 and 900 K. Al-doped Mg2Si1-xSnx samples are n-type in the measured temperature range. By Al-doping, electron concentration is controlled up to 5.3 x 1019 cm-3 in the composition range 0.0 ≤ x ≤ 0.1. Al-doped Mg2Si0.9Sn0.1 shows a maximum value of the figure of merit ZT of 0.68 at 864 K, which is 6 times larger than that of nondoped Mg2Si0.9Sn0.1
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2007.11.029Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2007.11.029;
- PII
- S0925-8388(07)02155-X;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 466
- Journal Issue
- 1-2
- Journal Page Range
- p. 335-340
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40016959
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRONS; HALL EFFECT; IMPURITIES; INTERMETALLIC COMPOUNDS; MAGNESIUM ALLOYS; PERFORMANCE; SEMICONDUCTOR MATERIALS; SILICON ALLOYS; SINTERING; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THERMAL CONDUCTIVITY; THERMOELECTRIC MATERIALS; THERMOELECTRIC PROPERTIES; TIN ALLOYS
- Descriptors DEC
- ALLOYS; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; FABRICATION; FERMIONS; LEPTONS; MATERIALS; PHYSICAL PROPERTIES; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.